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Understanding transmission electron microscopy diffraction patterns obtained from infrared semiconductor materials / by Wendy L. Sarney.
- Format:
- Book
- Government document
- Author/Creator:
- Sarney, Wendy L.
- Series:
- ARL-TR (Aberdeen Proving Ground, Md.) ; 3128.
- ARL-TR ; 3128
- Language:
- English
- Subjects (All):
- Diffraction patterns--Analysis.
- Diffraction patterns.
- Semiconductors--Materials--Structure--Analysis.
- Semiconductors.
- Transmission electron microscopes.
- Physical Description:
- 1 online resource (iv, 17 pages) : color illustrations.
- Place of Publication:
- Adelphi, MD : Army Research Laboratory, [2003]
- Notes:
- Title from title screen (viewed on Dec. 1, 2010).
- "December 2003."
- Includes bibliographical references.
- OCLC:
- 688596560
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