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Power MOSFET thermal instability operation characterization support / John L. Shue and Henning W. Leidecker.
Connect to full text Available online
View online- Format:
- Book
- Government document
- Author/Creator:
- Shue, John L.
- Series:
- NASA technical memorandum ; 216684.
- NASA/TM- ; 2010-216684
- Language:
- English
- Subjects (All):
- Metal oxide semiconductors.
- Field-effect transistors.
- Physical Description:
- 1 online resource (iv, 16 pages) : illustrations.
- Place of Publication:
- Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2010]
- Notes:
- Title from title screen (viewed on Nov. 8, 2010).
- "April 2010."
- Includes bibliographical references (page 16).
- OCLC:
- 679689185
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