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Test-to-failure of crystalline silicon modules : preprint / Peter Hacke, Kent Terwilliger, Steven Glick, David Trudell, Nick Bosco, Steve Johnston, and Sarah Kurtz.
- Format:
- Book
- Conference/Event
- Government document
- Author/Creator:
- Hacke, Peter, author.
- Terwilliger, Kent, author.
- Glick, Stephen H., author.
- Trudell, D. (David T.), author.
- Bosco, Nick, author.
- Johnston, Steven Wade, author.
- Kurtz, S. R., author.
- Conference Name:
- IEEE Photovoltaic Specialists Conference http://viaf.org/viaf/276809635
- Series:
- Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5200-47755.
- NREL/CP-5200-47755
- Language:
- English
- Subjects (All):
- Solar cells--Materials--Testing--Congresses.
- Solar cells.
- Photovoltaic cells--Materials--Testing--Congresses.
- Photovoltaic cells.
- Weathering--Congresses.
- Weathering.
- Genre:
- Congresses.
- proceedings (reports)
- Conference papers and proceedings
- Conference papers and proceedings.
- Physical Description:
- 1 online resource (7 pages) : illustrations.
- Place of Publication:
- Golden, CO : National Renewable Energy Laboratory, [2010]
- Summary:
- Accelerated lifetime testing of five crystalline silicon module designs was carried out according to the Terrestrial Photovoltaic Module Accelerated Test-to-Failure Protocol. This protocol compares the reliability of various module constructions on a quantitative basis. The modules under test are subdivided into three accelerated lifetime testing paths: 85 degreesC/85% relative humidity with system bias, thermal cycling between -40 degreesC and 85 degreesC, and a path that alternates between damp heat and thermal cycling. Ability to withstand electrolytic corrosion, moisture ingress, and ion drift under system voltage bias are differentiated according to module design. The results are discussed in light of relevance to field failures.
- Notes:
- Title from title screen (NREL, viewed Nov. 8, 2010).
- "October 2010."
- "Presented at the 35th IEEE Photovoltaic Specialists Conference, Honolulu, Hawaii, June 20-25, 2010."
- Includes bibliographical references.
- OCLC:
- 679705426
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