2 options
System for long-duration electrical testing of SiC IC generation 12 Chips at 500 °C / Stephanie Booth, David Spry, and Philip Neudeck.
Connect to full text Available online
View online- Format:
- Book
- Government document
- Author/Creator:
- Booth, Stephanie, author.
- Spry, David, author.
- Neudeck, Philip, author.
- Language:
- English
- Physical Description:
- 1 online resource (18 pages) : color illustrations
- Place of Publication:
- Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, January 2025.
- Notes:
- "January 2025."
- In scope of the U.S. Government Publishing Office Cataloging and Indexing Program (C&I) and Federal Depository Library Program (FDLP).
- Includes bibliographical references (page 18).
- Description based on online resource; title from PDF title page (NASA, viewed Feb. 3, 2025).
- OCLC:
- 1493330644
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.