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Stability of CIS/CIGS modules at the outdoor test facility over two decades : preprint / J.A. del Cueto [and others].

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Format:
Book
Conference/Event
Government document
Contributor:
Cueto, J. A. del
National Renewable Energy Laboratory (U.S.)
Conference Name:
IEEE Photovoltaic Specialists Conference (33rd : 2008 : San Diego, Calif.)
Series:
Conference paper (National Renewable Energy Laboratory (U.S.)) ; 520-42541.
NREL/CP ; 520-42541
Language:
English
Subjects (All):
Photovoltaic cells--Research.
Photovoltaic cells.
Solar cells--Testing.
Solar cells.
Genre:
technical reports.
Technical reports
Technical reports.
Physical Description:
1 online resource (6 pages) : illustrations.
Other Title:
Stability of copper indium diselenide/copper indium gallium diselenide modules
Place of Publication:
Golden, CO : National Renewable Energy Laboratory, 2008.
Summary:
We examine the status and question of long-term stability of copper indium diselenide (CIS) photovoltaic (PV) module performance for numerous modules that are deployed in the array field, or on the roof of, the outdoor test facility (OTF) at NREL, acquired from two manufacturers. Performance is characterized with current-voltage (I-V) measurements obtained either at standard test conditions (STC) or under real-time monitoring conditions, taken over the course of many years. We present and scrutinize I-V characteristics for degradation modes. Analysis yields that CIS PV modules can exhibit either moderate (2% to 4% per year) to negligible or small (less than 1% per year) degradation rates, and that the predominant loss mode appears to be fill factor diminution, often associated with increases in the series resistance in some of the modules. A secondary mode of degradation observed comprises metastable changes to the open-circuit voltage. The featured modules are deployed on three separate testbeds.
Notes:
Title from title screen (viewed June 11, 2008).
"May 2008."
"Presented at the 33rd IEEE Photovoltaic Specialists Conference, San Diego, California, May 11-16, 2008."
Includes bibliographical references (page 6).
OCLC:
231698478

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