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Reliability / Rudner, Lawrence M. [and] Schafer, William D.
- Format:
- Book
- Government document
- Author/Creator:
- Rudner, Lawrence M.
- Series:
- ERIC/AE digest series ; EDO-TM-01-01
- Language:
- English
- Subjects (All):
- Educational tests and measurements.
- Examinations--Scoring.
- Examinations.
- Place of Publication:
- College Park, MD : ERIC Clearinghouse on Assessment and Evaluation, [2001]
- Notes:
- Title from title screen (viewed January 31, 2003).
- Distributed to depository libraries in microfiche (1 microfiche), shipping list no.: 2003-0085-M.
- OCLC:
- 51553036
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