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Crystalline silicon short-circuit current degradation study : initial results / C.R. Osterwald, J. Pruett, and T. Moriarty.
Connect to full text Available online
View online- Format:
- Book
- Government document
- Author/Creator:
- Osterwald, C. R.
- Series:
- Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-520-37357.
- Conference paper ; NREL/CP-520-37357
- Language:
- English
- Subjects (All):
- Silicon--Electric properties.
- Silicon.
- Short circuits.
- Physical Description:
- 1 online resource (4 pages)
- Place of Publication:
- Golden, Colo. : National Renewable Energy Laboratory, [2005]
- Notes:
- Title from title screen (viewed on Apr 27, 2006).
- "February 2005."
- OCLC:
- 67768788
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