Secondary ion mass spectrometry in the earth sciences gleaning the big picture from a small spot edited by Mostafa Fayek

Format:

Book

Contributor:

Fayek, Mostafa

Series:

Short course series (Nepean, Ont.) v. 41

Short course series v. 41

Language:

English

Subjects (All):

Secondary ion mass spectrometry.

Physical Description:

1 online resource

Place of Publication:

Toronto Mineralogical Association of Canada ©2009

Contents:

An introduction to secondary ion mass spectrometry (SIMS) in geology / Richard A. Stern

In situ oxygen isotope geochemistry by ion microprobe / John W. Valley & Noriko T. Kita

Hydrogen, carbon, nitrogen and sulfur isotope microanalyses by secondary ion mass spectrometry / Mostafa Fayek

Lithium, boron and chlorine isotope determination by SIMS / Graham D. Layne

Quaternary geochronology by SIMS / Axel K. Schmitt

Improving depth profile measurements of natural materials : lessons learned from electronic materials depth-profiling / Jerry L. Hunter, Jr.

Notes:

"Short course sponsored by the Mineralogical association of Canada and delivered at the 2009 joint assembly of the AGU, GAC<MAC<CGU<and IAH, Toronto, Ontario, 22-23 May, 2009"

Includes bibliographical references

Print version record

Other Format:

Print version Secondary ion mass spectrometry in the earth sciences

ISBN:

9780921294818

0921294816

OCLC:

1517256164

Access Restriction:

Restricted for use by site license