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Measuring economic downside risk and severity : growth at risk / Yan Wang and Yudong Yao.

World Bank Open Knowledge Repository (formerly "World Bank E-Library Publications") Available online

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Format:
Book
Government document
Author/Creator:
Wang, Yan, 1953-
Contributor:
World Bank Institute. Economic Policy and Poverty Reduction.
Yao, Yudong.
Series:
Policy research working papers ; 2674.
World Bank e-Library.
Policy research working paper ; 2674
Language:
English
Subjects (All):
Business cycles.
Economic development.
Risk management.
Risk.
Other Title:
Policy research working paper vol. 2674
Place of Publication:
Washington, D.C. : World Bank, World Bank Institute, Economic Policy and Poverty Reduction Division, [2001]
System Details:
data file
Summary:
Using growth at risk as a measure of downside growth risk, the authors find that higher perceived levels of downside growth risk seem to be negatively associated with long-term growth.
Notes:
"September 2001."
Title from title screen as viewed on Aug. 30, 2002.
Includes bibliographical references (p. 21-24).
Publisher Number:
10.1596/1813-9450-2674

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