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GaP heteroepitaxy on Si(100) benchmarking surface signals when growing GaP on Si in CVD ambients by Henning Döscher

Springer Nature - Springer Physics and Astronomy (R0) eBooks 2013 English International Available online

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Format:
Book
Author/Creator:
Döscher, Henning, author.
Series:
Springer theses
Springer Theses 2190-5053
Language:
English
Subjects (All):
Optical materials.
Physics.
physics.
Medical Subjects:
Physics.
Physical Description:
1 online resource
Place of Publication:
Cham Springer [2013]
Language Note:
English
Summary:
Epitaxial integration of III-V semiconductors on silicon substrates has been desired over decades for high application potential in microelectronics, photovoltaics, and beyond. The performance of optoelectronic devices is still severely impaired by critical defect mechanisms driven by the crucial polar-on-nonpolar heterointerface. This thesis reports almost lattice-matched growth of thin gallium phosphide films as a viable model system for III-V/Si(100) interface investigations
Contents:
Introduction
Experimental
Si(100) surfaces in chemical vapor environments
GaP(100) and InP(100) surfaces
GaP growth on Si(100) and anti-phase disorder
Conclusion
Notes:
Includes bibliographical references
Online resource; title from PDF title page (ebrary, viewed January 6, 2014)
UofL: Multi-user access
Other Format:
Print version:
ISBN:
9783319028804
3319028804
3319028790
9783319028798
OCLC:
868922615
Access Restriction:
Restricted for use by site license

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