In-situ materials characterization across spatial and temporal scales Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken, editors

Format:

Book

Contributor:

Ziegler, Alexander, Prof. Dr., editor.

Graafsma, Heinz, editor.

Zhang, Xiao-Feng, 1963- editor.

Frenken, Joost W. M., editor.

Series:

Springer series in materials science v. 193

Springer series in materials science 0933-033X volume 193

Language:

English

Subjects (All):

Materials--Testing.

Materials.

Materials--Mechanical properties.

Physical Description:

1 online resource

Place of Publication:

Heidelberg New York Springer [2014]

Language Note:

English

Summary:

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction

Contents:

Scanning Probe Microscopy on 'Live' Catalysts

In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources

Advanced in situ transmission electron microscopy

Ultra-fast TEM and Electron Diffraction

In-Situ Materials Characterization with FIB/SEM

In-situ X-ray photoelectron spectroscopy

'Real-time' probing of photo-induced molecular processes in liquids by ultrafast X-ray absorption spectroscopy

Time-Resolved Neutron Scattering

Novel Detectors for Ultra-fast XRD, TEM and ED Characterization

Notes:

Online resource; title from PDF title page (viewed Apr. 14, 2014)

Includes bibliographical references and index

Other Format:

Print version In-situ Materials Characterization

ISBN:

9783642451522

3642451527

OCLC:

876601282

Access Restriction:

Restricted for use by site license