Theoretical concepts of x-ray nanoscale analysis theory and applications Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov

Format:

Book

Author/Creator:

Benediktovich, Andrei, author.

Feranchuk, I. D. (Ilya D.), author.

Ulyanenkov, Alexander P., author.

Series:

Springer series in materials science v. 183

Springer Series in Materials Science 0933-033X v. 183

Language:

English

Subjects (All):

X-rays--Industrial applications.

X-rays.

Nanostructured materials.

Nanostructures.

Medical Subjects:

Nanostructures.

Physical Description:

1 online resource

Place of Publication:

Heidelberg Springer [2013?]

Summary:

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike

Contents:

Basic principles of the interaction between X-rays and matter

X-ray reflectivity

High-resolution X-ray diffraction

Grazing-incidence small-angle X-ray scattering

Theory of X-ray scattering from imperfect crystals

X-ray diffraction for evaluation of residual stresses in polycrystals

Methods of mathematical and physical optimization of X-ray data analysis

Notes:

Includes bibliographical references and index

Online resource; title from PDF title page (SpringerLink, viewed September 9, 2013)

Other Format:

Print version Benediktovitch, Andrei. Theoretical Concepts of X-Ray Nanoscale Analysis : Theory and Applications

ISBN:

9783642381775

3642381774

OCLC:

858914991

Access Restriction:

Restricted for use by site license