Frontiers in optical methods nano-characterization and coherent control Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, editors

Format:

Book

Contributor:

Shudo, Ken-ichi, editor.

Katayama, Ikufumui, 1977- editor.

Ohno, Shin-ya, editor.

Series:

Springer series in optical sciences ; 0342-4111 180

Springer Series in Optical Sciences 0342-4111 180

Language:

English

Subjects (All):

Reflectance spectroscopy.

Terahertz spectroscopy.

Coherence (Optics).

Physical Description:

1 online resource

Place of Publication:

Heidelberg Springer 2014

Summary:

This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan

Contents:

State-of-Art of Terahertz Science and Technology

Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films

Single Photon Counting and Passive Microscopy of Terahertz Radiation

Coherent Phonons in Carbon Nanotubes

Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation

Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures

Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy

Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring

Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique

Terahertz Light Source Based on Synchrotron Radiation

Terahertz Synchrotron Radiation; Optics and Application

Far-infrared Spectroscopy on Solids under Ultra High Pressures

Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy

Notes:

Includes bibliographical references and index

Online resource; title from PDF title page (SpringerLink, viewed December 10, 2013)

Other Format:

Printed edition:

ISBN:

9783642405945

3642405940

3642405932

9783642405938

OCLC:

870683312

Access Restriction:

Restricted for use by site license