Historical evolution toward achieving ultrahigh vacuum in JEOL electron microscopes Nagamitsu Yoshimura

Format:

Book

Author/Creator:

Yoshimura, Nagamitsu, author.

Series:

SpringerBriefs in applied sciences and technology 2191-530X

SpringerBriefs in Applied Sciences and Technology 2191-530X

Language:

English

Subjects (All):

Electron microscopes.

Physical Description:

1 online resource

Place of Publication:

Tokyo Springer [2013?]

Summary:

This book describes the developmental history of the vacuum system of the transmission electron microscope (TEM) at the Japan Electron Optics Laboratory (JEOL) from its inception to its use in today s high-technology microscopes. The author and his colleagues were engaged in developing vacuum technology for electron microscopes (JEM series) at JEOL for many years. This volume presents a summary and explanation of their work and the technology that makes possible a clean ultrahigh vacuum. The typical users of the TEM are top-level researchers working at the frontiers of new materials or with new biological specimens. They often use the TEM under extremely severe conditions, with problems sometimes occurring in the vacuum system of the microscopes. JEOL engineers then must work as quickly as possible to improve the vacuum evacuation system so as to prevent the recurrence of such problems. Among the wealth of explanatory material in this book are examples of users reports of problems in the vacuum system of the JEM, such as the occurrence of a micro-discharge and the back-streaming of the diffusion pump (DP) oil vapor. This work is a valuable resource for researchers who use the transmission electron microscope and for engineers and scientists interested in its technology

Contents:

Introduction of the electron microscope

History of JEOL electron microscopes

Accidents and information, instructing us to improve the vacuum systems of JEMs

Development of the evacuation systems for JEMs

Development of JEOL SIPs

Ultrahigh vacuum electron microscopes

Notes:

Includes bibliographical references

Online resource; title from PDF title page (SpringerLink, viewed September 16, 2013)

Other Format:

Print version Yoshimura, Nagamitsu. Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes

ISBN:

9784431544487

4431544488

OCLC:

859256886

Access Restriction:

Restricted for use by site license