Guidelines for the determination of standardized semiconductor radiation hardness parameters / International Atomic Energy Agency.

Format:

Book

Author/Creator:

International Atomic Energy Agency, author.

Language:

English

Subjects (All):

Ionizing radiation.

Semiconductors.

Physical Description:

1 online resource (104 pages)

Edition:

First edition.

Place of Publication:

Vienna, Austria : International Atomic Energy Agency, [2023]

Summary:

This publication by the International Atomic Energy Agency outlines standardized procedures for assessing the radiation hardness of semiconductor devices. It seeks to provide a consistent approach to evaluate the effects of ionizing radiation on electronic materials used in high-radiation environments, such as nuclear facilities and aerospace. The guidelines incorporate both experimental procedures and theoretical models to predict how radiation affects device performance. The book is intended for professionals and technologists in the field of semiconductor material analysis and design, particularly those working with ion beam techniques. It also serves as a resource for solid-state physicists and engineers aiming to enhance the durability and performance of electronic devices in harsh radiation conditions. Generated by AI.

Notes:

Description based on publisher supplied metadata and other sources.

Part of the metadata in this record was created by AI, based on the text of the resource.

Description based on print version record.

Other Format:

Print version: IAEA Guidelines for the Determination of Standardized Semiconductor Radiation Hardness Parameters

ISBN:

9789201226235

OCLC:

1376931732