Nanometer CMOS ICs : From Basics to ASICs / by Harry Veendrick.

Format:

Book

Author/Creator:

Veendrick, H. J. M. (Harry J. M.)

Series:

Engineering Series

Language:

English

Subjects (All):

Electronic circuits.

Electronics.

Electronic Circuits and Systems.

Electronics and Microelectronics, Instrumentation.

Local Subjects:

Electronic Circuits and Systems.

Electronics and Microelectronics, Instrumentation.

Physical Description:

1 online resource (697 pages)

Edition:

3rd ed. 2025.

Place of Publication:

Cham : Springer International Publishing : Imprint: Springer, 2025.

Summary:

This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 3nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design, fabrication and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, Infineon, TSMC, etc., courseware, which, to date, has been completed by more than 7000 engineers working in a large variety of the above mentioned disciplines. Provides semester-length textbook, with comprehensive coverage of nanometer CMOS integrated circuits; Provides fully updated overview of all IC disciplines for all semiconductor professionals; Enables readers to gain understanding of the complete development chain, from physics to applications.

Contents:

Chapter 1 Basic Principles

Chapter 2 Geometrical, physical and field-scaling impact on MOS transistor behaviour

Chapter 3 Manufacture of MOS devices

Chapter 4 CMOS circuit, layout and library design

Chapter 5 Special circuits, devices and technologies

Chapter 6 Memories

Chapter 7 Very Large Scale Integration (VLSI) and ASICs

Chapter 8 Less power, a hot topic in IC design

Chapter 9 Robustness of nanometer CMOS designs: signal integrity, variability and reliability

Chapter 10 Testing, yield, packaging, debug and failure analysis

Chapter 11 Effects of scaling on MOS IC design and consequences for the roadmap.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

9783031642494

303164249X

OCLC:

1463767757