2025 IEEE/ACM International Workshop on Automated Program Repair (APR) / IEEE.

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author, issuing body.

Language:

English

Subjects (All):

Software engineering--Congresses.

Software engineering.

Machine learning--Congresses.

Machine learning.

Physical Description:

1 online resource

Place of Publication:

Piscataway, NJ : IEEE Computer Society, 2025.

Contents:

Half Title Page 1-1

Title Page 1-1

Copyright Page 1-1

Table of Contents v-vi

Which Inputs Trigger My Patch? 3-10

by Martin Eberlein, Moeketsi Raselimo, Lars Grunske

Can GPT-O1 Kill All Bugs? An Evaluation of GPT-Family LLMs on QuixBugs 11-18

by Haichuan Hu, Ye Shang, Guolin Xu, Congqing He, Quanjun Zhang

SCHOLIA- An XAI Framework for APR 19-26

by Nethum Lamahewage, Nimantha Cooray, Ridwan Shariffdeen, Sandareka Wickramanayake, Nisansa de Silva

FusionRepair: Iterative Multi-Line APR via Fusion 27-34

by Jayanath Senevirathna, Ayesh Vininda, Prasad Sandaruwan, Ridwan Shariffdeen, Sandareka Wickramanayake, Nisansa de Silva

Towards Unveiling Vulnerability Remediation Tactics from OSS Community 35-39

by Lyuye Zhang, Jiahui Wu, Chengwei Liu, Kaixuan Li, Sen Chen, Yang Liu

Memorization in LLM-Based Program Repair 40-42

by Jiaolong Kong, Mingfei Cheng, Xiaofei Xie

Bogus Bugs, Duplicates, and Revealing Comments: Data Quality Issues in NPR 43-47

by Julian Aron Prenner, Romain Robbes

Simple Fault Localization Using Execution Traces 48-55

Studying and Understanding the Effectiveness and Failures of Conversational LLM-Based Repair 56-59

by Aolin Chen, Haojun Wu, Qi Xin, Steven P. Reiss, Jifeng Xuan

Author Index.

Notes:

Description based on publisher supplied metadata and other sources.

Includes index.

ISBN:

979-83-315-2585-9