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Retroreflex Ellipsometry for Nonplanar Surfaces / Chia-Wei Chen.
- Format:
- Book
- Author/Creator:
- Chen, Chia-Wei, author.
- Series:
- Schriftenreihe automatische sichtprüfung und bildverarbeitung
- Language:
- English
- Subjects (All):
- Ellipsometry.
- Physical Description:
- 1 online resource (xx, 174 pages) : illustrations.
- Place of Publication:
- Karlsruhe : KIT Scientific Publishing, 2025.
- Summary:
- Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.
- Notes:
- Description based on publisher supplied metadata and other sources.
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