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2023 IEEE International Test Conference in Asia (ITC-Asia) / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Computer software--Testing.
- Computer software.
- Integrated circuits--Testing.
- Integrated circuits.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- 2023 IEEE International Test Conference in Asia
- Place of Publication:
- IEEE
- Piscataway, NJ : IEEE, 2023.
- Contents:
- ITC-Asia 2023 Cover Page
- Organizing Committee
- Steering Committee
- Program Committee
- Scalable hierarchical DFT technologies for AI, SOC and multi-die : Tutorial 1
- Silicon Lifecycle Management: Trends, Challenges and Solutions : Tutorial 2
- Semiconductor Packaging Revolution in the Era of Chiplets : Keynote 1
- Technology for The Future of Computing : Keynote 2
- Moore Meets Murphy : Invited Talk 1
- Test industry challenges and solutions as observed by the leading physical implementation solution provider : Invited Talk 2
- ITC-Asia 2023 Cover Page
- A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 9798350312812
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