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Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024) / edited by Sumeet S. Aphale, Ajit Jha.
- Format:
- Book
- Language:
- English
- Subjects (All):
- Automation--Congresses.
- Automation.
- Physical Description:
- 1 online resource
- Other Title:
- Fourth International Conference on Testing Technology and Automation Engineering
- Place of Publication:
- Bellingham, Washington 98227-0010 USA : SPIE, 2024.
- Summary:
- This PDF file contains the front matter associated with SPIE Proceedings Volume 13439, including the Title Page, Copyright information, Table of Contents, and Conference Committee information.
- Notes:
- Description based on publisher supplied metadata and other sources.
- Includes bibliographical references and index.
- ISBN:
- 1-5106-8665-7
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