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Optical Metrology and Inspection for Industrial Applications XI / Sen Han, Gerd Ehret, Benyong Chen, editors.
- Format:
- Book
- Language:
- English
- Subjects (All):
- Optical detectors--Industrial applications--Congresses.
- Optical detectors.
- Quality control--Optical methods--Congresses.
- Quality control.
- Physical Description:
- 1 online resource
- Place of Publication:
- Bellingham, Washington : SPIE, 2024.
- Contents:
- Session 1 (5)
- Session 2 (6)
- Session 3 (6)
- Session 4 (4)
- Session 5 (9)
- Session 6 (4)
- Session 7 (2)
- Session 8 (3)
- Poster Session (36).
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5106-8211-2
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