Full Field Optical Metrology and Applications / Fernando Mendoza-Santoyo [and three others].

Format:

Book

Author/Creator:

Mendoza-Santoyo, Fernando, author.

Contributor:

Institute of Physics (Great Britain), publisher.

Series:

IOP series in advances in optics, photonics and optoelectronics.

IOP Series in Advances in Optics, Photonics and Optoelectronics Series

Language:

English

Subjects (All):

Metrology.

Optical measurements.

Physical Description:

1 online resource (various pagings) : illustrations (some color).

Edition:

First edition.

Place of Publication:

Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]

System Details:

Mode of access: World Wide Web.

System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.

Biography/History:

Fernando Mendoza Santoyo is an Emeritus Professor at Centro de Investigaciones en Optica-CIO, México, where he was the founder of the Optical Metrology Division in 1991.

Summary:

This book introduces non-contact optical techniques based on the speckle effect in more detail.

Contents:

1. Foundations of optical interferometry

1.1. Light waves

1.2. Types of interferometers

1.3. Interference of light waves

1.4. Multiple wave interference

1.5. White-light interferometry

1.6. Holographic interferometry

2. Coherence

2.1. Introduction : the background

2.2. Basic principles of coherence

2.3. Temporal coherence

2.4. Partial coherence

2.5. Spatial coherence

3. Phase retrieval

3.1. Phase sampling evaluation

3.2. Modern methods for phase retrieval

3.3. Interference phase demodulation

4. Laser speckle metrology

4.1. Basics for laser speckle metrology

4.2. Laser speckle measurements

5. Moiré interferometry

5.1. Introduction

5.2. Moiré pattern formulation

5.3. Moiré pattern alignment

5.4. Shape detection via the moiré pattern

6. Holography

6.1. Digital holographic interferometry

7. Digital speckle pattern interferometry (DSPI)

7.1. Background

7.2. DSPI technique

7.3. The sensitivity vector, the displacement vector, and the optical phase difference

7.4. In-plane and out-of-plane sensitive set-ups

7.5. Phase-stepping interferometry

7.6. Vibration modes obtained with DSPI

8. 3D digital holographic interferometry

8.1. Principle

8.2. Illuminating once at a time

8.3. Illuminating at the same time (simultaneously)

8.4. Strain measurement using DHI

8.5. Deformation in 3D measurements

8.6. Amplitude and phase calculation for harmonic excitation with pulsed object illumination : an example

9. Digital holographic microscopy for surface profilometry

9.1. Introduction

9.2. Digital holographic microscopy

9.3. Optical phase unwrapping by multi-wavelength digital holographic microscopy

9.4. Digital holography using low coherence sources

10. Contouring

10.1. Two points of object illumination

10.2. Two-wavelength contouring

10.3. Contouring from experimental data

11. Optical coherence tomography

11.1. OCT configurations

11.2. Optical phase in spectral OCT

11.3. Examples of depth-resolved phase measurement

12. Digital image correlation

12.1. A brief introduction to digital image correlation

12.2. Two-dimensional digital image correlation

12.3. Three-dimensional digital image correlation

13. Speckle-noise reduction in optical techniques by non-local means methods

13.1. Introduction

13.2. Non-local means methods

13.3. Examples

14. Overview of recent applications using DHI

14.1. Introduction

14.2. Basic applications of DHI

15. A couple of trending applications related to holography

15.1. Electron holographic interferometry

15.2. Quantum holography.

Notes:

"Version: 20221201"--Title page verso.

Includes bibliographical references.

Title from PDF title page (viewed on January 9, 2023).

Description based on print version record.

ISBN:

9780750330268

0750330260

9780750330275

0750330279

OCLC:

1358413911