Wideband Microwave Materials Characterization / John W. Schultz.

Format:

Book

Author/Creator:

Schultz, John W., author.

Language:

English

Subjects (All):

Microwave measurements.

Microwaves.

Optoelectronics.

Physical Description:

1 online resource (331 pages)

Edition:

First edition.

Place of Publication:

Norwood, MA : Artech House, [2023]

Summary:

Determining intrinsic microwave properties or extrinsic performance of materials is important for a variety of applications, including wireless propagation, antenna and microwave circuit design, and remote sensing, among others. This practical engineering guide to microwave material measurements discusses both laboratory and manufacturing/field environments. Modern technology has created a need to adapt microwave measurement methods for in-line quality assurance, in-situ process control, and field inspection of materials and components. The book covers the various configurations for free-space measurements, but also provides guidance on calibration methods, signal processing, and intrinsic property inversion algorithms. Learn how the modern adaptation of impedance analysis to CEM inversion methods and how this powerful new technique can be used to significantly improve conventional measurement methods. Intended to inform engineers and scientists of the theory and practice of wide-band microwave characterization of materials, this guide provides the necessary theory and equations for implementing these methods and gives hints and techniques for their practical implementation.

Notes:

Description based on publisher supplied metadata and other sources.

Description based on print version record.

Includes bibliographical references and index.

ISBN:

9781523162529

152316252X

9781630819477

1630819476

OCLC:

1378389429