1 option
Third International Conference on Testing Technology and Automation Engineering (TTAE 2023) / Zain Anwar Ali, Inès Chihi, editors.
- Format:
- Book
- Language:
- English
- Subjects (All):
- Artificial intelligence--Congresses.
- Artificial intelligence.
- Physical Description:
- 1 online resource
- Place of Publication:
- Bellingham, Washington : SPIE, 2024.
- Contents:
- ront Matter: Volume 13079 (1)
- Intelligent Instrument and Precision Monitoring Technology (22)
- Intelligent Machinery Manufacturing and Automation Control (23).
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5106-7477-2
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