Power integrity : measuring, optimizing, and troubleshooting power related parameters in electronics systems / Steven M. Sandler.

Format:

Book

Author/Creator:

Sandler, Steven M., author.

Series:

McGraw-Hill's AccessEngineering

Language:

English

Subjects (All):

Electric power supplies to apparatus.

Electronics.

Genre:

Electronic books.

Physical Description:

1 online resource

Edition:

First edition.

Place of Publication:

New York, N.Y. : McGraw-Hill Education, [2014]

Language Note:

In English.

Summary:

Proven techniques for generating high-fidelity measurements. Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems provides field-tested techniques for producing high-fidelity measurements using the appropriate equipment. The book thoroughly discusses measurement guidelines, test instrument selection and use, connecting the equipment to the device being tested, and interpreting the acquired data. The latest electronics technologies and their impact on measurement are discussed. Detailed photographs, screenshots, schematics, and equations are included throughout this practical guide. Learn how to accurately measure: Impedance, Stability, Power supply rejection ratio (PSRR), Reverse transfer and crosstalk, Step load response, Ripple and noise, Edges, High-frequency impedance.

Contents:

A. About the author

B. Dedication

C. Acknowledgments

1. Introduction

What you will learn from this book

Who will benefit from this book

The general format of this book

2. Measurement philosophy

Cause no damage

Measure without influencing the measurement

Validate the test setup and measurement limits

Measure in the most efficient and direct way

Document measurements thoroughly

3. Measurement fundamentals

Sensitivity

Noise floor

Dynamic range

Noise density

Signal averaging

Scaling

Attenuators

Preamplifiers

Measurement domains

Endnotes

4. Test instruments

Frequency response analyzers and vector network analyzers

Oscilloscopes

Spectrum analyzers

Signal generators

Tdr/tdt s-parameter analyzers

5. Probes, injectors, and interconnects

Voltage probes

6. The distributed system

Noise paths within a voltage regulator

Control loop stability

How poor stability propagates through the system

7. Measuring impedance

Selecting a measurement method

8. Measuring stability

Stability and why it matters

9. Measuring psrr

Measurement methods

Modulating the input

Choosing the measurement domain

10. Reverse transfer and crosstalk

Reverse transfer of various topologies

Modulating the output current

Measuring the input current

Measuring the input voltage

Indirect measurement

11. Measuring step load response

Generating the transient

Measuring the response(s)

12. Measuring ripple and noise

Connecting the equipment

Choosing the equipment

Averaging and filtering

13. Measuring edges

Relating bandwidth and rise time

Sampling rate and interleaved sampling

Interpolation

Coaxial cables

The criticality of the probe connection

Printed circuit board issues

Probes

14. Troubleshooting with near-field probes

The basics of emissions

The near-field probes

Probe and orientation

The measurement instrument

Spectrum gating

15. High-frequency impedance measurement

Time domain

Calibration

Reference plane

Setting tdr pulse rise time

Interpreting tdr measurements

Estimating inductance and capacitance

S-parameter measurements

Endnotes.

Notes:

Includes bibliographical references and index.

Electronic reproduction. New York, N.Y. : McGraw Hill, 2014. Mode of access: World Wide Web. System requirements: Web browser. Access may be restricted to users at subscribing institutions.

Description based on cover image and table of contents, viewed on Jan. 20, 2015.

Other Format:

Print version: Power integrity : measuring, optimizing, and troubleshooting power related parameters in electronics systems.

ISBN:

9780071830997 (print-ISBN)

0071830995 (print-ISBN)

OCLC:

903347083

Access Restriction:

Restricted for use by site license.