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Nanoscale CMOS VLSI circuits : design for manufacturability / Sandip Kundu, Aswin Sreedhar.

McGraw-Hill's AccessEngineering Available online

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Format:
Book
Author/Creator:
Kundu, Sandip, author.
Contributor:
Sreedhar, Aswin.
Penn, Michael
Fogarty, David E.
Darnell, Matt.
Kundu, Sandip.
Series:
McGraw-Hill's AccessEngineering
Language:
English
Subjects (All):
Metal oxide semiconductors, Complementary--Design and construction.
Metal oxide semiconductors, Complementary.
Integrated circuits--Very large scale integration--Design and construction.
Integrated circuits.
Genre:
Electronic books.
Physical Description:
1 online resource
Edition:
First edition.
Other Title:
Nanoscale complementary metal oxide semiconductor very large-scale integration circuits
Place of Publication:
New York, N.Y. : McGraw-Hill Education, [2011]
Language Note:
In English.
Summary:
Covering the latest devices; technologies; and processes; this detailed guide offers proven methods for optimizing circuit designs to increase the yield; reliability; and manufacturability of products and mitigate defects and failure.
Contents:
Semiconductor manufacturing
Process and device variability : analysis and modeling
Manufacturing-aware physical design closure
Metrology, manufacturing defects, and defect extraction
Defect impact modeling and yield improvement techniques
Physical design and reliability
Design for manufacturability : tools and methodologies.
Notes:
Print version c2010.
Includes bibliographical references and index.
Electronic reproduction. New York, N.Y. : McGraw Hill, 2011. Mode of access: World Wide Web. System requirements: Web browser. Access may be restricted to users at subscribing institutions.
Description based on cover image and table of contents, viewed on July 27, 2011.
Contains:
Semiconductor manufacturing.
Process and device variability: analysis and modeling.
Manufacturing-aware physical design closure.
Metrology, manufacturing defects, and defect extraction.
Defect impact modeling and yield improvement techniques.
Physical design and reliability.
Design for manufacturability: tools and methodologies.
Other Format:
Print version: Nanoscale CMOS VLSI circuits : design for manufacturability.
ISBN:
007177632X
9780071635196
007163519X (print-ISBN)
OCLC:
670295267
Access Restriction:
Restricted for use by site license.

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