The Social World, Reexamined : A Conversation with Brian Epstein.

Format:

Book

Author/Creator:

Burton, Howard.

Series:

Ideas Roadshow Conversations

Language:

English

Subjects (All):

Econometric models.

Economics.

Political science.

Physical Description:

1 online resource (59 pages)

Edition:

1st ed.

Other Title:

Ideas Roadshow Conversations

Place of Publication:

Toronto : Open Agenda Publishing, 2020.

Summary:

This book is based on an in-depth filmed conversation between Howard Burton and Brian Epstein, Associate Professor of Philosophy at Tufts University. Brian Epstein's career as a management consultant piqued his interest and his later research into the reasons why our current models of economics, politics and other areas of social science so often go terribly wrong. The conversation explores how we can dramatically improve our current economic and political models by reexamining our assumptions about the nature of the social world.This carefully-edited book includes an introduction, The Real World, and questions for discussion at the end of each chapter. Howard Burton was the Founding Director of Canada's Perimeter Institute for Theoretical Physics. He holds a PhD in theoretical physics and an MA in philosophy. This book is part of an expanding series of 100+ Ideas Roadshow conversations, each one presenting a wealth of candid insights from a leading expert in a focused yet informal setting to provide a uniquely accessible window into frontline research and scholarship that wouldn't otherwise be encountered through standard lectures and textbooks.

Contents:

Intro

A Note on the Text

Introduction

The Conversation

I. Wondering About the World

II. Empirical Influences

III. Unquestioned Assumptions

IV. Beyond Emergence

V. Ontological Examinations

VI. Better Models

VII. Modelling Concerns

VIII. Getting Specific

IX. No, We Can't

X. Responses and Reactions

XI. The Value of Breadth

XII. Learning Our Lessons?

XIII. Applied Philosophy

Continuing the Conversation.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

9781771700467

1771700467

OCLC:

1250078613