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1671.1-2017/Cor 1-2023 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1 / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author.
- Language:
- English
- Subjects (All):
- Automatic test equipment.
- Physical Description:
- 1 online resource (15 pages)
- Place of Publication:
- New York, USA : IEEE, 2024.
- Summary:
- Corrections to the XML Schema files to achieve full consistency with the text of the standard are addressed in this corrigendum. Additional files are also placed in the 1671 directory here: https://standards.ieee.org/wp-content/uploads/2024/04/1671.1-2017-cor1-2023-downloads.zip.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 979-88-557-0693-2
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