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2023 IEEE Far East NDT New Technology & Application Forum (FENDT) / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Nondestructive testing--Congresses.
- Nondestructive testing.
- Technological innovations--Congresses.
- Technological innovations.
- Physical Description:
- 1 online resource
- Other Title:
- 2023 IEEE Far East NDT New Technology & Application Forum
- Place of Publication:
- IEEE
- [Place of publication not identified] : IEEE, 2023.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 9798350303544
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