Light field imaging for deflectometry / by David Uhlig.

Format:

Book

Author/Creator:

Uhlig, David, author.

Series:

Forschungsberichte aus der industriellen informationstechnik ; 2190-6629. band 31

Forschungsberichte aus der industriellen informationstechnik, 2190-6629 ; band 31

Language:

English

Subjects (All):

Optical measurements.

Image processing.

Signal processing.

Physical Description:

1 online resource

Place of Publication:

Karlsruhe : KIT Scientific Publishing, [2023]

Summary:

"Optical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurement of specular surfaces. It presents improvements in phase unwrapping and calibration techniques, enabling high surface reconstruction accuracies using only a single monocular light field camera."--Publisher's website.

Notes:

Includes bibliographical references.

Open access. This is an Open Access book distributed under the terms of the Creative Commons Attribution + ShareAlike 4.0 (CC BY-SA) license, which enables reusers to distribute, remix, adapt, and build upon the material in any medium or format, so long as attribution is given to the creator. If you remix, adapt, or build upon the material, you must license the modified material under identical terms. Copyright is retained by the author(s).

Description based on website home page, viewed February 20, 2024.