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Assessment of Selected Divisions of the Physical Measurement Laboratory at the National Institute of Standards and Technology: Fiscal Year 2021

EBSCOhost Academic eBook Collection (North America) Available online

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Format:
Book
Author/Creator:
National Academies of Sciences, Engineering, and Medicine, author.
Division on Engineering and Physical Sciences, author.
Laboratory Assessments Board, author.
Committee on NIST Technical Programs, author.
Panel on Assessment of Selected Divisions of the Physical Measurement Laboratory at the National Institute of Standards and Technology, author.
Contributor:
National Academies of Sciences, Engineering, and Medicine
Division on Engineering and Physical Sciences
Laboratory Assessments Board
Committee on NIST Technical Programs
Panel on Assessment of Selected Divisions of the Physical Measurement Laboratory at the National Institute of Standards and Technology
Division on Engineering and Physical Sciences, author.
Laboratory Assessments Board, author.
Committee on NIST Technical Programs, author.
Panel on Assessment of Selected Divisions of the Physical Measurement Laboratory at the National Institute of Standards and Technology, author.
Language:
English
Subjects (All):
Physical measurements.
Quantum communication.
Physical Description:
1 online resource (52 p.)
Place of Publication:
National Academies Press
Summary:
At the request of the National Institute of Standards and Technology (NIST), the National Academies of Sciences, Engineering, and Medicine has, since 1959, annually assembled panels of experts from academia, industry, medicine, and other scientific and engineering environments to assess the quality and effectiveness of the NIST measurements and standards laboratories, as well as the adequacy of the laboratories' resources. This report assesses the scientific and technical work performed by the NIST Physical Measurement Laboratory in the Quantum Measurement Division, Radiation Physics Division, Sensor Science Division, Microsystems and Nanotechnology Division, and Nanoscale Device Characterization Division.
Notes:
Part of the metadata in this record was created by AI.
ISBN:
0-309-09371-6

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