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Fiabilidad y validez de constructo del test munsh para medir felicidad, en poblacion de adultos mayores chilenos / Emilio Moyano Diaz, Ema Flores Moraga, Heli Soromaa.
- Format:
- Book
- Author/Creator:
- Moyano Diaz, Emilio.
- Language:
- Spanish
- Subjects (All):
- Psychology--Industrial and organizational psychology.
- Psicologia--Psicologia industrial y organizativa.
- Local Subjects:
- Psychology--Industrial and organizational psychology.
- Psicologia--Psicologia industrial y organizativa.
- Physical Description:
- 567-580 pp.
- Cuatrimestral
- Place of Publication:
- Bogota : Universidad Nacional de Colombia, 2011.
- OCLC:
- 823745355
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