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Modelo de vigilancia tecnológica basado en patrones asociados a factores críticos / autor: Marta Beatriz Infante Abreu ; tutores: Prof. Tit., Ing. Mercedes Delgado Fernández, Prof. Tit., Ing. Antonio Díaz Batista.
- Format:
- Book
- Thesis/Dissertation
- Author/Creator:
- Infante Abreu, Marta Beatriz.
- Language:
- Spanish
- Subjects (All):
- Industrial engineering.
- Ingeniería industrial.
- Local Subjects:
- Ingeniería industrial.
- Genre:
- Libros electronicos.
- Physical Description:
- 1 online resource (vi, 142 páginas) : gráficos, tablas
- Place of Publication:
- La Habana : Editorial Universitaria, 2015.
- Notes:
- Tesis Doctor en Ciencias Técnicas Instituto Superior Politécnico "José Antonio Echeverría" 2013.
- Contiene bibliografía.
- Description based on online resource; title from PDF title page (ebrary, viewed March 12, 2015).
- ISBN:
- 959-16-2867-6
- OCLC:
- 1105908865
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