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ISTFA 2017 : conference proceedings from the 43rd International Symposium for Testing and Failure Analysis : November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA / organized by ASM International.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Symposium for Testing and Failure Analysis (43rd : 2017 : Pasadena, California, USA)
- Language:
- English
- Subjects (All):
- Electronics--Materials--Testing--Congresses.
- Electronics.
- Electronic apparatus and appliances--Testing--Congresses.
- Electronic apparatus and appliances.
- Physical Description:
- 1 online resource (xix, 645 pages) : illustrations
- Place of Publication:
- Materials Park, Ohio : ASM International, [2017]
- Summary:
- The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
- Notes:
- Description based on print version record.
- ISBN:
- 1-5231-2785-6
- 1-62708-151-8
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