1 option
Functionality-enhanced devices : an alternative to Moore's law / edited by Pierre-Emmanuel Gaillardon.
- Format:
- Book
- Series:
- Materials, circuits and devices series.
- Materials, circuits and devices series
- Language:
- English
- Subjects (All):
- Nanoelectromechanical systems--Design and construction.
- Nanoelectromechanical systems.
- Metal oxide semiconductors, Complementary.
- Electronic apparatus and appliances--Design and construction.
- Electronic apparatus and appliances.
- Physical Description:
- 1 online resource (360 pages).
- Edition:
- 1st ed.
- Place of Publication:
- London, United Kingdom : The Institution of Engineering and Technology, 2018.
- Summary:
- The book provides thorough and systematic coverage of enhanced-functionality devices and their use in proof-of-concept circuits and architectures. The theory and materials science behind these devices are addressed in detail, and various experimental fabrication techniques are explored.
- Contents:
- Intro
- Title
- Copyright
- Contents
- Part I Materials and device research related to functionality-enhanced devices
- 1 Introduction to functionality-enhanced devices
- 1.1 General background
- 1.1.1 Advanced transistor scaling
- 1.1.2 Emerging devices
- 1.1.3 Toward nanosystems
- 1.2 Book organization
- Acknowledgments
- References
- 2 Germanium-based polarity-controllable transistors
- 2.1 Introduction
- 2.2 Theory and device simulations
- 2.3 Fabrication of polarity-controllable germanium nanowire transistors
- 2.4 Electrical characteristics of polarity-controllable germanium nanowire transistors
- 2.5 Benchmark and perspectives
- 2.6 Conclusions
- 3 Two-dimensional materials for functionality-enhanced devices
- 3.1 2D materials for functionality-enhanced devices
- 3.1.1 Introduction
- 3.1.2 Non-carbon 2D materials with bandgaps
- 3.2 Large area growth of 2D materials
- 3.2.1 Introduction
- 3.3 Metal-semiconductor contacts and 2D heterostructures
- 3.4 2D materials for steep slope devices
- 3.4.1 Band to band carrier tunneling (BTBT) in 2D systems
- 3.4.2 Tunnel field effect transistors
- 3.4.3 Resonant tunneling devices/diodes
- 3.5 Circuit and system applications
- 3.5.1 RF applications
- 3.6 List of abbreviations
- 4 WSe2 polarity-controllable devices
- 4.1 Two-dimensional transition metal dichalcogenides
- 4.1.1 Synthesis of two-dimensional materials
- 4.1.2 Value of ambipolarity
- 4.2 Polarity-controllable devices on WSe2
- 4.3 Quantum transport simulations
- 4.4 Summary
- 5 Carrier type control of MX2 type 2D materials for functionality-enhanced transistors
- 5.1 MX2 materials
- 5.1.1 2D materials for FEDs
- 5.1.2 Crystalline structure and electric characteristics of TMDCs
- 5.2 MX2 materials in transistors.
- 5.2.1 Need for 2D materials channel in advanced FETs
- 5.2.2 Carrier doping
- 5.2.3 Carrier injection via Schottky junctions
- 5.2.4 Fermi level pinning
- 5.3 Polarity controllable transistors on MoTe2
- 5.3.1 Ambipolar channels for polarity controllable transistors
- 5.3.2 MoTe2 channel
- 5.3.3 Single top gate device on MoTe2
- 5.3.4 Dual top-gate device on MoTe2
- 5.3.5 Issues in top-gate dielectrics
- 5.4 Enhanced ambipolarity by Schottky junction engineering in MoTe2
- 5.4.1 Schottky junctions in MoTe2
- 5.4.2 Barrier heights of MoTe2 Schottky junctions
- 5.4.3 Enhanced ambipolarity in MoTe2
- 5.5 Conclusions
- 6 Three-independent gate FET's super steep subthreshold slope
- 6.1 Introduction
- 6.2 Subthreshold slope
- 6.3 TIGFET background
- 6.4 TIGFET working principle
- 6.5 Structure and fabrication of TIGFETs
- 6.5.1 Device structure and fabrication
- 6.6 SS dependency in TIGFETs
- 6.6.1 Experimental dependency on voltage
- 6.6.2 Origin of voltage dependency
- 6.6.3 Experimental dependency on temperature
- 6.6.4 Origin of temperature dependency
- 6.7 SS behavior from device simulations
- 6.7.1 TCAD Sentaurus design
- 6.7.2 SS dependency on long-channel devices
- 6.7.3 SS dependency on voltage
- 6.7.4 SS dependency on TIGFET's short-channel effects
- 6.8 Conclusion
- Acknowledgment
- 7 Super sensitive terahertz detectors
- 7.1 Principles of THz detection in FETs
- 7.1.1 Dyakonov-Shur model
- 7.1.2 Theoretical formalism and modes of operation
- 7.1.3 Nonresonant detection: principles and advantages of subthreshold biasing
- 7.2 Overview of THz detectors and state of the art
- 7.2.1 Recent progress on nanowire-based THz detectors
- 7.2.2 Recent progress on graphene-based THz detectors.
- 7.3 Emerging FET devices for THz detection applications: dual independent gate FinFET with super-steep subthreshold slope
- 7.3.1 A continuous compact DC model
- 7.3.2 Noise-equivalent power predictions
- 7.4 Conclusions
- Part II Applications and design techniques of functionality-enhanced devices
- 8 CNT and SiNW modeling for dual-gate ambipolar logic circuit design
- 8.1 Desired model characteristics
- 8.1.1 Connection to underlying physics
- 8.1.2 Experimental matching
- 8.1.3 SPICE compatibility
- 8.1.4 PG modulation
- 8.1.5 Dynamic polarity switching (interchangeability)
- 8.2 Single-gate physically derived models
- 8.2.1 Unipolar SPICE model for ballistic CNTFETs
- 8.2.2 Unipolar Verilog-A model for doped CNTFETs
- 8.2.3 Ambipolar VHDL-AMS model for CNTFETs
- 8.2.4 Experimental matching
- 8.2.5 Connection to underlying physics
- 8.2.6 SPICE compatibility
- 8.2.7 PG modulation
- 8.2.8 Dynamic polarity switching (interchangeability)
- 8.3 Behavioral ambipolar models
- 8.3.1 Ambipolar model for double-independent-gate FinFETs
- 8.3.2 Ambipolar Verilog-A model for CNTFETs
- 8.3.3 Connection to underlying physics
- 8.3.4 Experimental matching
- 8.3.5 SPICE compatibility
- 8.3.6 PG modulation
- 8.3.7 Dynamic polarity switching (interchangeability)
- 8.4 Comprehensive semiconductor compensation simulation
- 8.4.1 Ambipolar TCAD simulation for WSe2FETs
- 8.4.2 Ambipolar TCAD simulation for SiNWFETs
- 8.4.3 Connection to underlying physics
- 8.4.4 Experimental matching
- 8.4.5 SPICE compatibility
- 8.4.6 PG modulation
- 8.4.7 Dynamic polarity switching (interchangeability)
- 8.5 Physical ambipolar models
- 8.5.1 MATLAB model for multiple-independent-gate FETs
- 8.5.2 Ambipolar VHDL-AMS model with binary PG for CNTFETs
- 8.5.3 Ambipolar Verilog-A model for CNTFETs.
- 8.5.4 Ambipolar model for SiNWFETs
- 8.5.5 Connection to underlying physics
- 8.5.6 Experimental matching
- 8.5.7 SPICE compatibility
- 8.5.8 PG modulation
- 8.5.9 Dynamic polarity switching (interchangeability)
- 8.6 Ambipolar models with dynamic polarity
- 8.6.1 Dynamic Verilog-A model with fixed source and drain for CNTFETs
- 8.6.2 Dynamic Verilog-A model with source-drain interchangeability for CNTFETs
- 8.6.3 Connection to underlying physics
- 8.6.4 Experimental matching
- 8.6.5 SPICE compatibility
- 8.6.6 PG modulation
- 8.6.7 Dynamic polarity switching (interchangeability)
- 8.7 Summary
- 9 Physical design of polarity controllable transistors
- 9.1 Introduction
- 9.1.1 IC design and FPGA-ASIC gap
- 9.1.2 Ambipolar devices for Moore's law extension
- 9.1.3 Physical design objectives
- 9.2 Background
- 9.2.1 Structured ASICs
- 9.2.2 SiNWFET physical design concepts
- 9.3 SiNWFET tile layout and placement and routing
- 9.3.1 Tile configuration for FinFETs
- 9.3.2 Tile configuration for SiNWFETs
- 9.3.3 Pin and layout generation
- 9.4 SOCE configuration
- 9.4.1 Placement schemes
- 9.4.2 Power routing schemes
- 9.5 Results and comparisons
- 9.5.1 Benchmarking methodology
- 9.5.1.1 Benchmark categories
- 9.5.1.2 Benchmark summary
- 9.5.1.3 Performance metrics
- 9.5.2 Benchmark results
- 9.5.3 Comparisons and conclusions
- 9.6 Conclusions
- 10 BCB benchmarking for three-independent-gate field effect transistors
- 10.1 Introduction
- 10.2 TIGFET principles
- 10.2.1 Generalities
- 10.2.2 Fabrication techniques
- 10.2.3 Working principle
- 10.2.4 Logic behavior
- 10.3 Device-level considerations
- 10.3.1 Electrical properties
- 10.3.2 Capacitance consideration
- 10.3.3 Layout considerations
- 10.4 Circuit-level opportunities
- 10.5 Performance evaluation.
- 10.5.1 Area estimation
- 10.5.1.1 Area summary
- 10.5.2 Delay estimation
- 16.5.3 Energy estimation
- 10.5.4 Standby power estimation
- 10.6 Comparison of technologies
- 10.6.1 Device-level performance
- 10.6.2 Circuit-level performance
- 10.6.3 Origin of EDP results
- 10.7 Conclusion
- 11 Exploratory logic synthesis for multiple independent gate FETs
- 11.1 Introduction
- 11.2 Survey on emerging MIGFETs
- 11.2.1 Double-gate silicon nanowire field effect transistor
- 11.2.2 Independent-gate-FinFET-LVth
- 11.2.3 Independent-gate-FinFET-HVth
- 11.2.4 Triple-gate-floating-gate metal-oxide-semiconductor (MOS)
- 11.2.5 Triple-gate-silicon nanowire field effect transistor
- 11.2.6 Logic abstraction and discussion
- 11.3 Logic synthesis for MIGFETs
- 11.3.1 Brief overview on logic synthesis
- 11.3.2 Circuit design considerations
- 11.3.3 Synthesis methodology
- 11.4 Experimental results
- 11.4.1 Methodology
- 11.5 Custom exploration of special MIGFET classes
- 11.5.1 Potential of XOR MIGFETs
- 11.5.2 Potential of MAJ MIGFETs
- 11.5.3 Summary
- 11.6 Conclusions
- 12 Ultrafine grain FPGAs with polarity controllable transistors
- Abstract
- 12.1 Background
- 12.1.1 FPGA architecture
- 12.1.2 Transistors with controllable polarity
- 12.1.3 Ultrafine grain reconfigurable logic gates
- 12.2 Leveraging the ultrafine granularity at the architecture level
- 12.2.1 Multilayer organization
- 12.2.2 Intramatrix interconnecting
- 12.2.3 Integration into FPGA architecture
- 12.3 MCluster CAD flow
- 12.3.1 General overview of the flow
- 12.3.2 MPack: the matrix packer
- 12.3.3 Matrix mapping algorithm
- 12.3.3.1 Architectural optimization
- 12.3.3.2 Mapping algorithm
- 12.4 Experimental results
- 12.3.4 Clustering algorithm
- 12.4.1 Methodology
- 12.4.2 Impact of the granularity.
- 12.4.3 Performance comparison with CMOS.
- Notes:
- Description based on print version record.
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-83724-817-6
- 1-78561-559-9
- OCLC:
- 1206401853
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.