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Characterisation and control of defects in semiconductors / edited by Filip Tuomisto.
- Format:
- Book
- Series:
- Materials, circuits and devices series ; Volume 45.
- Materials, circuits and devices series ; 45
- Language:
- English
- Subjects (All):
- Semiconductors--Defects.
- Semiconductors.
- Physical Description:
- 1 online resource (xvi, 578 pages) : illustrations.
- Place of Publication:
- London, England : The Institution of Engineering and Technology, 2020.
- Summary:
- Understanding the formation and introduction mechanisms of defects in semiconductors is essential to understanding their properties. Although many defect-related problems have been identified and solved over the past 60 years of semiconductor research, the quest for faster, cheaper, lower power, and new kinds of electronics generates an ongoing need for new materials and properties, and so creates new defect-related challenges.
- Notes:
- Includes index.
- Description based on print version record.
- ISBN:
- 1-83724-754-4
- 1-5231-2743-0
- 1-78561-656-0
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