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Means and methods for measurement and monitoring : advanced micro-device engineering VIII : selected, peer reviewed papers from the 8th International Conference on Advanced Micro Device Engineering (AMDE 2016), December 9, 2016, Kiryu, Japan / edited by Osamu Hanaizumi.
EBSCOhost Academic eBook Collection (North America) Available online
EBSCOhost Academic eBook Collection (North America)- Format:
- Book
- Language:
- English
- Subjects (All):
- Nanotechnology--Congresses.
- Nanotechnology.
- Microelectromechanical systems--Congresses.
- Microelectromechanical systems.
- Physical Description:
- 1 online resource (106 pages)
- Place of Publication:
- Zürich, Switzerland : Trans Tech Publications Ltd., [2019]
- Summary:
- This special issue is the supplement book of proceedings of the 8th International Conference on Advanced Micro-Device Engineering (AMDE 2016) organized by the Human Resource Cultivation Center, Gunma University, held on 9 December 2016 in Kiryu, Japan. Thematic area of this volume is "Measurement and system technology." Biomedical Engineering, measurement, electronics, communication engineering, general engineering.
- Notes:
- Includes index.
- Description based on print version record.
- ISBN:
- 3-0357-3553-0
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