Silicon carbide and related materials 2012 : selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation / edited by Alexander A. Lebedev [and three others].

Format:

Book

Conference/Event

Author/Creator:

European Conference on Silicon Carbide and Related Materials, Corporate Author.

Contributor:

Lebedev, Alexander A., 1959-

Conference Name:

European Conference on Silicon Carbide and Related Materials (9th : 2012 : Saint Petersburg, Russia)

Series:

Materials science forum ; v. 740-742.

Materials science forum ; volumes 740-742

Language:

English

Subjects (All):

Silicon carbide--Congresses.

Silicon carbide.

Crystal growth--Congresses.

Crystal growth.

Genre:

Conference papers and proceedings.

Physical Description:

1 online resource (1158 p.)

Place of Publication:

Durnten-Zurich, Switzerland : Trans Tech Publications Ltd, [2013]

Language Note:

English

Summary:

The volume on Silicon Carbide and Related Materials is divided into 10 chapters ranging from ""Bulk growth"" to ""Device and application"". The reports demonstrate the technical and scientific advances in the related areas: 150 mm 4H-SiC wafers are now commercially available, a significant improvement of the carrier lifetime (up to 35 ms) for n-type SiC epi-layers has been achieved, SiC diodes have a large market share in server and telecom power applications requiring the maximum efficiency, and a variety of 1- cm 2 , 15 kV class bipolar devices have been demonstrated, including PN Diodes, IG

Contents:

Silicon Carbide and Related Materials 2012; Preface, Sponsors and Committees; Table of Contents; Chapter 1: Bulk Growth; Growth of 4H-SiC in Current-Controlled Liquid Phase Epitaxy; Growth of Low Basal Plane Dislocation Density 4H-SiC Crystals in Controlled Temperature Distribution inside the Crucible; SiC Single Crystal Growth on Dual Seed with Different Surface Properties; Effect of Surface Polarity on the Conversion of Threading Dislocations in Solution Growth; Morphological and Optical Stability in Growth of Fluorescent SiC on Low Off-Axis Substrates

Growth Rate and Surface Morphology of 4H-SiC Single Crystal Grown under Various Supersaturations Using Si-C SolutionApplication of 3-D X-Ray Computed Tomography for the In Situ Visualization of the SiC Crystal Growth Interface during PVT Bulk Growth; Investigation of Solution Growth of SiC by Temperature Difference Method Using Fe-Si Solvent; Real-Time Observation of High Temperature Interface between SiC Substrate and Solution during Dissolution of SiC; Polycrystalline SiC as Source Material for the Growth of Fluorescent SiC Layers

On Peculiarities of Defect Formation in 6Н-SiC Bulk Single Crystals Grown by PVT MethodAbsence of Back Stress Effect in the PVT Growth of 6H Silicon Carbide; Modeling of the Mass Transport during Homo-Epitaxial Growth of Silicon Carbide by Fast Sublimation Epitaxy; The Study of the Geometry and Growth Trend of Silicon Carbide Crystals; Structural Perfection of Silicon Carbide Crystals Grown on Profiled Seeds by Sublimation Method; Growth of Large Diameter 4H-SiC by TSSG Technique; SiC Sublimation Growth at Small Spacing between Source and Seed

High-Speed Growth of 4H-SiC Single Crystal Using Si-Cr Based MeltThe Effect of Modified Crucible Design and Seed Attachment on SiC Crystal Grown by PVT; Sublimation Growth of AlN and GaN Bulk Crystals on SiC Seeds; Growth of Low-Defect SiC and AlN Crystals in Refractory Metal Crucibles; Defect Generation Mechanisms in PVT-Grown AlN Single Crystal Boules; Sublimation Growth of Bulk AlN Crystals on SiC Seeds; Growth of (0001) AlN Single Crystals Using Carbon-Face SiC as Seeds; AlGaN Solid Solution Grown on 3C-SiC(111)/Si(111) Pseudosubstrates

Effect of a Gas Pressure on the Growth Rate of AlN LayerChapter 2: Graphen Growth and Characterization; Impact of Substrate Steps and of Monolayer-Bilayer Junctions on the Electronic Transport in Epitaxial Graphene on 4H-SiC (0001); X-Ray Diffraction and Raman Spectroscopy Study of Strain in Graphene Films Grown on 6H-SiC(0001) Using Propane-Hydrogen-Argon CVD; Optimising the Growth of Few-Layer Graphene on Silicon Carbide by Nickel Silicidation; Raman Spectroscopy and XPS Analysis of Epitaxial Graphene Grown on 4H-SiC (0001) Substrate under an Argon Pressure of 900 mbar Environment

A DC Comparison Study between H-Intercalated and Native Epi-Graphenes on SiC Substrates

Notes:

Description based upon print version of record.

Includes bibliographical references and index.

Description based on online resource; title from PDF title page (ebrary, viewed October 28, 2013).

ISBN:

3-03826-005-3