X-ray absorption fine structure for catalysts and surfaces / editor, Yasuhiro Iwasawa.

Format:

Book

Contributor:

Iwasawa, Yasuhiro, 1946-

Series:

World Scientific series on synchrotron radiation techniques and applications ; v. 2.

World Scientific series on synchrotron radiation techniques and applications ; v. 2

Language:

English

Subjects (All):

Extended X-ray absorption fine structure.

Catalysts.

Surfaces (Technology).

Physical Description:

1 online resource (428 p.)

Place of Publication:

Singapore ; River Edge, N.J. : World Scientific, c1996.

Language Note:

English

Summary:

X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including, e.g., catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique could be applied in a static or a dynamic state (in-situ condition). The XAFS can provide information that is not accessible by other techniques for characterization of materials, particularly catalysts and related surfaces. Furthermore, XAFS can provide a molecular-level approach to the study of reaction mechan

Contents:

PREFACE; CONTENTS; CHAPTER 1 INTRODUCTION; 1 Introduction; 1. EXAFS; 2. XANES/NEXAFS; 3. X-ray Sources; 4 X-Ray Absorption Fine Structure for Catalysts and Surfaces; 5. Future Prospects; 6 X-Ray Absorption Fine Structure for Catalysts and Surfaces; 6. References; CHAPTER 2 THEORY AND PARAMETERS OF EXAFS; 2 Theory and Parameters of EXAFS; 1. Introduction; 2. Simple Derivation of the EXAFS Formula; 3. Additional Factors for Real Systems; 4. Justification of Several Approximations; 5. Cumulant Expansion Method; 6. Model Distribution Method and Splice Method; 7. Mean Square Relative Displacement

8. Anharmonic Interatomic Potential9. Polarization Dependence of EXAFS; 10. Parameters of Backscattering Amplitude and Phase Shift; 11. References; 3 Analysis of EXAFS; 1. Introduction; 2. Data Processing before the Analysis; 3. Determination of Origin of Photoelectron Wave Vector and Conversion to k from Photoelectron Energy; 4. Extraction of EXAFS Oscillation and Normalization; 4.1. Averaging the data points over some data sequences or using appropriate weight and then the central; 4.2. Cubic spline technique; 4.3. Spline smoothing; 4.4. General comments on background removal

4.5. Normalization5. Fourier Transformation; 6. Curve Fitting Analysis; 6.1. Phase shift and amplitude functions; 6.2. Analysis of the higher shells; 6.3. Parameterization; 6.4. Least square curve fitting; 6.5. Correlation problems; 7. Other Ways of Elucidation of Structure Parameters; 7.1. Ratio method; 7.2. Phase corrected Fourier transformation; 8. Asymmetric Distribution and Disorder Effects; 8.1. Model independent method; 8.2. Model dependent analysis; 8.3. Reverse Monte Carlo [65]; 9. References; CHAPTER 4 THEORY AND ANALYSIS OF XANES; 4.1 MO Approach; 1. Introduction

2. One-Electron Picture of XANES3. Equivalent Core Approximation; 4. Bond-length and Bond-angle Dependence of o* Resonance Energies; 5. Crystal Field Theory and the Walsh Diagram; 6. Hybridization with Ligand MOs; 7. Core-hole Screening Effect; 8. References; 4.2 Multiple Scattering Approach; 1. Introduction; 2. Basic Formulas for X-ray Absorption Intensities; 3. Cancellation of Intrinsic and Extrinsic Losses; 4. Multiple Scattering Formulas of XANES; 5. Thermal Effects and Optical Potential; 6. An Example of an Application; 7. References; CHAPTER 5 MEASUREMENT OF XAFS; 5.1 Instrumentation

1. Introduction2. Synchrotron Radiation; 3. X-ray Optics; 3.1. Crystal monochromators; 3.2. Mirrors; 3.3. Focusing of the X-ray beam; 4. Detection Systems; 4.1. Detectors for XAFS in transmission modes; 4.2. Detectors for fluorescence XAFS; 4.3. Detectors for soft X-ray; 5. Design of Experiments; 5.1. XAFS in the transmission mode; 5.2. Fluorescence XAFS; 5.3. Trouble shooting; 6. References; 5.2 In Situ XAFS Measurement of Catalysts; 5.2 In Situ XAFS Measurement of Catalysts; 1. Introduction; 2. General Presentation of the Different Reactor Cells; 3. The Classic Cell; 4. The Sulfuration Cell

5. The High Temperature and High Pressure Cell

Notes:

Description based upon print version of record.

Includes bibliographical references and index.

ISBN:

9789812830838

9812830839