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Advanced device modeling and simulation / editor, T. Grasser.

EBSCOhost Academic eBook Collection (North America) Available online

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EBSCOhost eBook Community College Collection Available online

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Format:
Book
Contributor:
Grasser, Tibor.
Series:
Selected topics in electronics and systems ; vol. 31.
Selected topics in electronics and systems ; vol. 31
Language:
English
Subjects (All):
Microelectronics.
Simulation methods.
Physical Description:
1 online resource (217 p.)
Place of Publication:
River Edge, N.J. : World Scientific, c2003.
Language Note:
English
Summary:
Microelectronics is one of the most rapidly changing scientific fields today. The tendency to shrink devices as far as possible results in extremely small devices which can no longer be described using simple analytical models. This book covers various aspects of advanced device modeling and simulation. As such it presents extensive reviews and original research by outstanding scientists. The bulk of the book is concerned with the theory of classical and quantum-mechanical transport modeling, based on macroscopic, spherical harmonics and Monte Carlo methods.
Contents:
INTRODUCTION; CONTENTS; MODELING ELECTRON TRANSPORT IN MOSFET DEVICES:EVOLUTION AND STATE OF THE ART; 1. Introduction; 2. A Brief History of Conventional Device Modeling; 3. Quantum Mechanical Modeling; 3.1. Models Based on Quantum Corrections: Macroscopic Models; 3.2. One-Dimensional and Quasi-Two-Dimensional Quantum Modeling; 3.3. Full Quantum Modeling: Microscopic Models; 4. Conclusions; Acknowledgments; References; PARTICLE MODELS FOR DEVICE SIMULATION; 1. Introduction; 2. The Numerical Monte Carlo Method; 2.1. General Scheme; 2.2. Monte Carlo Integration; 2.3. Integral Equations
3. The Transient Boltzmann Equation3.1. Transient MC Algorithms; 3.2. Integral Form of the Boltzmann Equation; 3.3. The Ensemble MC Method; 3.4. The Weighted EMC Method; 3.5. The Backward MC Method; 4. The Stationary Boltzmann Equation; 4.1. Stationary MC Algorithms; 4.2. Integral Form of the Stationary Boltzmann Equation; 4.3. The Single-Particle MC Method; 4.3.1. The Synchronous Ensemble Method; 4.3.2. The Time Averaging Method; 4.3.3. MC Evaluation of the Iteration Series; 4.3.4. Normalization of the Distribution Function; 4.4. The Weighted Single-Particle MC Method
4.4.1. Modified Probabilities4.4.2. Evolution of the Weights; 4.4.3. Results and Discussions; 4.5. The Single-Particle Backward MC Algorithm; 5. Small-Signal MC Algorithms; 6. The Stationary Wigner-Boltzmann Equation; 6.1. The Particle Model; 6.2. Stationary MC Method; 7. Conclusions; Acknowledgment; References; EFFECTIVE POTENTIALS AND QUANTUM FLUID MODELS:A THERMODYNAMIC APPROACH; 1. Introduction; Effective Potential Approaches; Quantum Fluid Models; 2. Quantum Kinetic Equations; 3. Moment Closures and Effective Potentials; 3.1. Bohm Potentials; 3.2. Thermodynamic Approximations
Effective Potentials:Quantum Hydrodynamics:; 4. Thermodynamic Equilibrium; 5. Approximations to Thermal Equilibrium; 5.1. Semiclassical Approximations; 5.2. Born Approximation; 6. Effective Potentials and Particle Discretizations; 7. Quantum Hydrodynamics; 7.1. The Semiclassical Closure; 7.2. Smoothed Potential QHD Based on the Born Approximation; 8. Applications; 8.1. Effective Potentials in Short Channel MOSFETS; 8.2. Smooth QHD Simulation of the Resonant Tunneling Diode; 9. Conclusions; References
SELF-CONSISTENT MODELING OF MOSFET QUANTUM EFFECTS BY SOLVING THE SCHRODINGER AND BOLTZMANN SYSTEM OF EQUATIONS BOLTZMANN SYSTEM OF EQUATIONS1. Introduction; 2. Methodology; 2.1. Mathematical Model; 2.2. General Approach; 2.3. Schrödinger Equation; 2.4. Poisson, Semiclassical Boltzmann and Hole Continuity Equations; 2.5. Quantum Boltzmann Equation and Effective Quantum Potential; 3. Simulation Results; 4. Conclusions; Acknowledgment; References; HYDRODYNAMIC MODELING OF RF NOISE FOR SILICON-BASED DEVICES; 1. Introduction; 2. Fluctuations in the Steady-State; 3. Hydrodynamic Noise Modeling
3.1. The noiseless hydrodynamic model
Notes:
Description based upon print version of record.
Includes bibliographical references.
ISBN:
9789812705280
9812705287

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