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Microelectronics failure analysis [electronic resource] : desk reference / edited by The Electronic Device Failure Analysis Society, Desk Reference Committee.
EBSCOhost Academic eBook Collection (North America) Available online
EBSCOhost Academic eBook Collection (North America)EBSCOhost eBook Community College Collection Available online
EBSCOhost eBook Community College Collection- Format:
- Book
- Language:
- English
- Subjects (All):
- Microelectronics--Materials--Testing--Handbooks, manuals, etc.
- Microelectronics--Defects--Testing--Handbooks, manuals, etc.
- Physical Description:
- 1 online resource (812 p.)
- Edition:
- 5th ed.
- Place of Publication:
- Materials Park, OH : ASM International, 2004.
- Language Note:
- English
- Contents:
- ""Contents""; ""GENERAL""; ""FAULT LOCALIZATION � PACKAGE LEVEL""; ""FAULT LOCALIZATION � DIE LEVEL""; ""DEPROCESSING AND IMAGING TECHNIQUES""
- Notes:
- Includes bibliographical references and index.
- ISBN:
- 1-61503-266-5
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