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ISTFA '98 : proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas / sponsored by ISFTA, ASM International.
EBSCOhost Academic eBook Collection (North America) Available online
EBSCOhost Academic eBook Collection (North America)- Format:
- Book
- Conference/Event
- Conference Name:
- International Symposium for Testing and Failure Analysis (24th : 1998 : Dallas, Tex.)
- Language:
- English
- Subjects (All):
- Electronics--Materials--Testing--Congresses.
- Electronics.
- Electronic apparatus and appliances--Testing--Congresses.
- Electronic apparatus and appliances.
- Physical Description:
- 1 online resource (452 p.)
- Place of Publication:
- Materials Park, OH : ASM International, c1998.
- Language Note:
- English
- Summary:
- Proceedings of a November 1998 symposium, with sections on advanced techniques in failure analysis, focused ion beam applications, military applications, ESD-induced failures, techniques in failure analysis and testing, discretes, packaging, backside analysis, and case histories. Specific subjects include thermally assisted photoemission for CMOS device analysis, graphical representation of permanent defects in hard disk drives, aluminum interconnect response to electrical overstress, and failure analysis of a qualification unit injector for a satellite thruster. Annotation copyrighted by Book News, Inc., Portland, OR
- Contents:
- ""Preface""; ""Table of Contents""; ""Index""
- Notes:
- Description based upon print version of record.
- Includes bibliographical references and index.
- ISBN:
- 1-61503-076-X
- OCLC:
- 929147739
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