Building a successful board-test strategy / Stephen F. Scheiber.

Format:

Book

Author/Creator:

Scheiber, Stephen F.

Series:

Test and Measurement Series

Language:

English

Subjects (All):

Printed circuits--Testing.

Printed circuits.

Physical Description:

1 online resource (350 p.)

Edition:

2nd ed.

Place of Publication:

Boston : Butterworth-Heinemann, c2001.

Language Note:

English

Summary:

Written in a clear and thoughtful style, Building a Successful Board-Test Strategy, Second Edition offers an integrated approach to the complicated process of developing the test strategies most suited to a company's profile and philosophy. This book also provides comprehensive coverage of the specifics of electronic test equipment as well as those broader issues of management and marketing that shape a manufacturer's ""image of quality.""In this new edition, the author adds still more ""war stories,"" relevant examples from his own experience, which will guide his readers in their dec

Contents:

Cover; Contents; Preface to the Second Edition; Chapter 1 What Is a Test Strategy?; 1.1 Why Are You Here?; 1.2 It Isn't Just Testing Anymore; 1.3 Strategies and Tactics; 1.3.1 The First Step; 1.3.2 Life Cycles; 1.4 The Design and Test Process; 1.4.1 Breaking Down the Walls; 1.4.2 Making the Product; 1.4.3 New Challenges; 1.5 Concurrent Engineering Is Not Going Away; 1.6 The Newspaper Model; 1.6.1 Error Functions; 1.6.2 What Do You Test?; 1.6.3 Board Characteristics; 1.6.4 The Fault Spectrum; 1.6.5 Other Considerations; 1.6.6 The How of Testing; 1.7 Test-Strategy Costs; 1.7.1 Cost Components

1.7.2 Committed vs. Out-of-Pocket Costs1.8 Project Scope; 1.9 Statistical Process Control; 1.10 Summary; Chapter 2 Test Methods; 2.1 The Order-of-Magnitude Rule; 2.2 A Brief (Somewhat Apocryphal) History of Test; 2.3 Test Options; 2.3.1 Analog Measurements; 2.3.2 Shorts-and-Opens Testers; 2.3.3 Manufacturing-Defects Analyzers; 2.3.4 In-Circuit Testers; 2.3.5 Bed-of-Nails Fixtures; 2.3.6 Bed-of-Nails Probe Considerations; 2.3.7 Opens Testing; 2.3.8 Other Access Issues; 2.3.9 Functional Testers; 2.3.10 Functional Tester Architectures; 2.3.11 Finding Faults with Functional Testers

5.6.4 Interconnect Test5.7 Other Alternatives; 5.8 Summary; Chapter 6 The VMEbus eXtension for Instrumentation; 6.1 VME Background; 6.2 VXI Extensions; 6.3 Assembling VXI Systems; 6.4 Configuration Techniques; 6.5 Software Issues; 6.6 Testing Boards; 6.7 The VXIbus Project; 6.8 Yin and Yang; 6.9 Summary; Chapter 7 Environmental-Stress Screening; 7.1 The ""Bathtub Curve""; 7.2 What Is Environmental-Stress Screening?; 7.3 Screening Levels; 7.4 Screening Methods; 7.4.1 Burn-in; 7.4.2 Temperature Cycling; 7.4.3 Burn-in and Temperature-Cycling Equipment; 7.4.4 Thermal Shock

7.4.5 Mechanical Shock and Vibration

Notes:

"Test & measurement world"--Cover.

Includes bibliographical references (p. 321-328) and index.

ISBN:

9786611009625

9781281009623

1281009628

9780080476124

0080476120

OCLC:

191034906