Advanced mathematical and computational tools in metrology and testing IX / editors, F. Pavese ... [et al.].

Format:

Book

Conference/Event

Contributor:

Pavese, Franco.

Conference Name:

AMCTM IX (2011 : Paris, France)

AMCTM IX

Series:

Series on advances in mathematics for applied sciences ; v. 84.

Series on advances in mathematics for applied sciences ; v. 84

Language:

English

Subjects (All):

Measurement--Congresses.

Measurement.

Physical measurements--Congresses.

Physical measurements.

Metrology--Congresses.

Metrology.

Physical Description:

1 online resource (468 p.)

Other Title:

AMCTM IX

Place of Publication:

Singapore : World Scientific, 2012.

Language Note:

English

Summary:

This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Göteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.

Contents:

Contents; Foreword; Recommended Tools for Sensitivity Analysis Associated to the Evaluation of Measurement Uncertainty A. Allard and N. Fischer; 1. Introduction; 2. Basic Sensitivity Methods; 2.1. The One At a Time Method (GUM-S1); 2.2. Pearson and Spearman Correlation Coefficients; 2.3. Application Case : Mass Calibration Example; 3. Variance-Based Sensitivity Indices; 3.1. Concepts; 3.2. Sobol' Estimation; 3.3. Local Polynomial Smoothers; 3.4. Application Case : Mass Calibration Example; 4. Conclusion; References; A Simple Confidence Interval for the Common Mean B. Arendacka

1. Introduction2. A Simple Confidence Interval; 3. Simulation Study; 4. Discussion; Acknowledgments; References; Estimation of Detailed Deviation Zone of Inspected Surfaces A. Barari; 1. Introduction; 2. Parametric Space; 3. Estimation of Geometric Deviations; 4. Experimental Validation; 5. Conclusions; Acknowledgments; References; Case Study of Likelihood and Bayes Approaches for Measurement Based on Nonlinear Regression A. Bariska and R. Burgin; 1. Introduction; 1.1. Measurements Based on Regression Problems; 1.2. Solving Regression Problems; 1.3. Document Outline

2. Overview of Likelihood and Bayes Approaches2.1. Likelihood; 2.2. Bayes; 3. Computational Methods; 3.1. Point Estimators; 3.1.1. Likelihood Approach; 3.1.2. Bayes Approach; 3.1.3. Initial Values; 3.2. Interval Estimators; 3.2.1. Likelihood Approach; 3.2.2. Bayes Approach; 4. Monte-Carlo Results; 4.1. Nonlinear Model Function; 4.2. Monte-Carlo Procedure; 4.3. Monte-Carlo Results; 5. Conclusions; Acknowledgments; References; Mathematical and Computational Aspects of Treatment Ordinal Measurement Results E. Bashkansky and T. Gadrich; 1. Introduction

2. The Description of an Ordinal Measurement Error, Repeatability and Uncertainty2.1. Error; 2.2. Repeatability (Precision); 2.3. Measurement Uncertainty; 3. Repeated Ordinal Measurements; 4. Comparison Between Two Ordinal Measuring Systems; 5. Comparison Between Several Ordinal Measuring Systems; 6. Traceability Problem; 7. Conclusions; References; Calibration of Ordinal Metrical Scale E. Benoit; 1. Introduction; 2. Calibration; 2.1. Representational Theory of Measurement; 2. 1. 1 Definitions; 2.2 Calibration of Weak Scales; 3. Ordinal Metrical Scales; 4. Application Example: Colour

5. ConclusionReferences; Comparison of Different Choices for a Prior Under Partial Information in a Bayesian Analysis O. Bodnar, G. Wubbeler and C. Elster; 1. Introduction; 2. Propriety of Posteriors; 3. Long-run Behavior; 4. Conclusion; References; Self-Consistent Reference Value Estimation W. Bremser; 1. Introduction; 2. Principles of the Approach; 3. Example: CCQM-P69; 4. Results and Discussion; 5. Conclusions; References; Uncertainty Modeling in 3D SEM Stereophotogrammetry L. Carli, M. Galetto and G. Genta; 1. Introduction; 2. Basic Principles of 3D SEM Stereophotogrammetry

3. Propagation of Uncertainties

Notes:

Description based upon print version of record.

Includes bibliographical references and index.

ISBN:

981-4397-95-4

OCLC:

794328429