2 options
ISTFA 2001 : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.)
- Language:
- English
- Subjects (All):
- Electronics--Materials--Testing--Congresses.
- Electronics.
- Electronic apparatus and appliances--Testing--Congresses.
- Electronic apparatus and appliances.
- Physical Description:
- 1 online resource (455 p.)
- Other Title:
- Proceedings of the 27th International Symposium or Testing and Failure Analysis
- Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis
- Place of Publication:
- Materials Park, OH : ASM International, c2001.
- Language Note:
- English
- Summary:
- Proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara, California. This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format. Contents include: Advanced techniques Packaging Backside analysis Scanning probe microscopy Focused ion beam (FIB) techniques Failure analysis of micro-electromechanical systems (MEMS) Yield improvement Discretes Defect-based testing Case histories.
- Contents:
- ""Preface""; ""Table of Contents""; ""IPFA 2000 Best Paper Award Winner""; ""Session 1: Advanced Techniques 1""; ""Session 2: Advanced Techniques 2""; ""Session 3: Packaging""; ""Session 4: Poster Session""; ""Session 5: Backside 1""; ""Session 6: SPM""; ""Session 7: Backside 2""; ""Session 8: Case Histories 1""; ""Session 9: FIB""; ""Session 10: Case Histories 2""; ""Session 11: MEMS""; ""Session 12: Techniques""; ""Session 13: Yield Improvement""; ""Session 14: Discretes""; ""Session 15: Defect-Based Testing""; ""Index""
- Notes:
- Sponsored by EDFAS, ISTFA.
- Includes bibliographical references and index.
- ISBN:
- 1-61503-085-9
- OCLC:
- 923570616
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.