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Measurement technology and intelligent instruments VI / editors, Yongsheng Gao, Shuetfung Tse, Wei Gao.
- Format:
- Book
- Series:
- Key engineering materials ; v. 295/296.
- Key engineering materials, 1013-9826 ; volumes 295-296
- Language:
- English
- Subjects (All):
- Engineering instruments.
- Measuring instruments.
- Physical Description:
- 1 online resource (753 p.)
- Place of Publication:
- Uetikon-Zuerich, Switzerland : Trans Tech Publications Ltd., [2005]
- Language Note:
- English
- Summary:
- The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology. Following the lead of the previous five publications (1989, 1993, 1996, 1998, 2001) in the series, ""Measurement Technology and Intelligent Instruments"", this
- Contents:
- Measurement Technology and Intelligent Instruments VI; Table of Contents; Laser Scattering Measurement of Microdefects on Silicon Oxide Wafer; Characterisation of Surface Properties by a Multi-Function TPM; Development of an Evanescent Light Measurement System for Si Wafer Microdefect Detection; An Embedded FBG Sensor for Dynamic Strain Measurement for a Clamped-Clamped Composite Structure; A Thermovision Method for Studying Deformation Kinetics of Materials and Structure Elements; Damage Detection of Composite Structures Using Dynamic Analysis
- Investigation of Nonisothermal Crystallization Behaviors of Poly and Silica Nanocomposites Using Differential Scanning CalorimetryEllipsometric Detection of Transitional Surface Structures on Decapped GaAs(001); Temperature Effect on the Stability of CuO Nanofluids Based on Measured Particle Distribution; Determination of Young's Modulus of Micromechanical Silicon Films Using an Acoustic Excitation and Optical Detection Resonance Method; A High Precision AFM for Nanometrology of Large Area Micro-Structured Surfaces
- A Study on the Mechanism of a New High Speed Scanning Miniature Nano-Measurement ProbeUse of Fiber Interferometer for AFM Cantilever Probe Displacement Control; Determining the Radial Modulus of DNA Measured by VPSFM; Pitch Calibration by an Active Temperature Controlled Traceable Atomic Force Microscope and a Laser Diffractometer; Micro-Force Calibration with an All-Coil Magnetic Levitation; Effect of Residual Stresses on a Micromachined Z-Axis Vibrating Rate Gyroscope; A Measurement System for Step Imprint Lithography; Design and Simulation of a DETF for Use in a Resonant Gyroscope
- Micro Angle Measurement for a Scanning StageDefocusing Detection of Geometric Sizes in Micro-Machining; A Biological Sensor for Detecting Foreign Bodies Using a Balloon Probe; A Resonant Frequency Measurement System for Osseointegration Trans-Femoral Implant; Innovative 3D Dental Measurement for Tooth Model Restoration; An Intelligent CO2 Sensor for Private Homes; A Hybrid Optical Correlator Used as an Intelligent Instrument; A Mobile Shearography System for Non-Destructive Testing of Industrial and Artwork Components
- A High Precision Three-Dimensional Optical Sensor Using Fourier Transform ProfilometryDevelopment and Verification of a Confocal Fabry-Perot Interferometer for Broad Band Ultrasound Detection; Laser Feedback Interferometers Based on Orthogonally Polarized He-Ne Lasers; A Two-Color Heterodyne Interferometer Based on Diffraction Grating for Displacement Measurement; A New Method for the Development of Frequency Standards for the Optical Wavelength Range of 243nm; Optical Measurement Technologies and Systems for Industrial Applications
- Influence of the Size of Round Objects on the Output Signal of Laser Measuring Scanner
- Notes:
- Description based upon print version of record.
- Includes bibliographical references and indexes.
- Description based on print version record.
- ISBN:
- 3-03813-022-2
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