Quality management for the technology sector / Joseph Berk and Susan Berk.

Format:

Book

Author/Creator:

Berk, Joseph, 1951-

Contributor:

Berk, Susan, 1955-

Language:

English

Subjects (All):

Quality control.

Factory management.

Physical Description:

1 online resource (219 p.)

Place of Publication:

Boston : Newnes, 2000.

Language Note:

English

Summary:

There are many standards, methods and perhaps most confusing, but most importantly of all acronyms in use in the field of quality management, and especially so in the field of technology-based products. From the seemingly simple concepts of ISO 9000 (and the military MIL standards from which that grew) to statistical and analytical methods like Statistical Process Control (SPC) the range of complexity and compliance is staggering. What the average quality engineer or manager needs is a simple guide to what these are, how they relate to one another and most critically how to take advantage of a

Contents:

Cover; Contents; Preface; Chapter 1. Managing for Quality in the High Tech Environment; Chapter 2. The Continuous Improvement Concept; Chapter 3. Finding Your Customers; Chapter 4. Quality Measurement Systems; Chapter 5. Problem Solving; Chapter 6. Systems Failure Analysis; Chapter 7. Employee Involvement and Empowerment; Chapter 8. Corrective Action Boards and Focus Teams; Chapter 9. Statistics for Nonstatisticians; Chapter 10. Statistical Process Control; Chapter 11. ANOVA, Taguchi, and Other Design of Experiments Techniques; Chapter 12. Quality Function Deployment

Chapter 13. Inventory ManagementChapter 14. Value Improvement; Chapter 15. Supplier Teaming and Procurement Quality Assurance; Chapter 16. D1-9000, ISO 9000, MIL-Q-9858, and MIL-STD-1520; Chapter 17. On-Time Delivery Performance Improvement; Case Study 1. The SLAP Designation Pointing Error; Case Study 2. Circuit Card Defects and Quality Measurement; Case Study 3. Laser Optics Debonding; Index

Notes:

Description based upon print version of record.

Includes bibliographical references and index.

ISBN:

1-281-04779-1

9786611047795

0-08-051551-7

OCLC:

179823126