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Pariahs : hubris, reputation and organisational crises / Matt Nixon ; foreword by Lord Owen.

EBSCOhost Academic eBook Collection (North America) Available online

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EBSCOhost Ebook Business Collection Available online

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Format:
Book
Author/Creator:
Nixon, Matt, author.
Contributor:
Owen, Lord, writer of foreword.
Language:
English
Subjects (All):
Business ethics.
Physical Description:
1 online resource (301 p.)
Place of Publication:
Faringdon, Oxfordshire : Libri Publishing, 2016.
Language Note:
English
Summary:
In the last few years repeated scandals have rocked their worlds of many industries. Stories which have hit the headlines recently have included news of - Deliberate cheating by car makers to evade emissions tests - LIBOR and FX manipulation by bankers - Falsification of drug testing results plus allegations of bribery and corruption in major pharmaceutical corporations - Unlawful tapping of phones of the famous by newspapers - Cover-ups over high death rates in hospitals. While it is not always obvious what has gone wrong, there is no disguising the widespread impact on many stakeholders, and the catastrophic loss of trust and sense of betrayal that results. Matt Nixon has had a privileged insider seat in several of the organizations which came to suffer major crises, crises which inspired deep emotional responses.
Contents:
Cover; Title Page; Copyright; Epigraph; Dedication; Contents; Acknowledgements; Foreword; Introduction; Part One - Introducing Pariahs; 1. Defining Pariahs; 2. The Case for Concern ; Part Two - Pariah Lifecycle Stages; 3. Pariah Lifecycle Model; 4. Genesis - Beginnings; 5. Hubris - Arrogant Overconfidence; 6. Crisis - Point of Failure; 7. Nemesis - Downfall; 8. Metamorphosis - Change; 9. Catharsis - Cleansing and Redemption; Part Three - Dealing with Pariahs; 10. Pariahs of the Future; 11. Employees of the Pariah Organisation; 12. Final Conclusions; Appendix 1; Appendix 2; Bibliography
Index
Notes:
Description based upon print version of record.
Includes bibliographical references and index.
Description based on print version record.
ISBN:
1-909818-86-0
1-909818-85-2

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