Statistical quality control : a loss minimization approach / Dan Trietsch.

Format:

Book

Author/Creator:

Trietsch, Dan.

Series:

Series on applied mathematics ; v. 10.

Series on applied mathematics ; v. 10

Language:

English

Subjects (All):

Quality control--Statistical methods.

Quality control.

Standardization.

Physical Description:

1 online resource (403 p.)

Place of Publication:

Singapore ; River Edge, NJ : World Scientific, c1999.

Language Note:

English

Summary:

While many books on quality espouse the Taguchi loss function, they do not examine its impact on statistical quality control (SQC). But using the Taguchi loss function sheds new light on questions relating to SQC and calls for some changes. This book covers SQC in a way that conforms with the need to minimize loss. Subjects often not covered elsewhere include: (i) measurements, (ii) determining how many points to sample to obtain reliable control charts (for which purpose a new graphic tool, diffidence charts, is introduced), (iii) the connection between process capability and tolerances, (iv)

Contents:

Table of Contents; Preface; Chapter 1 Introduction to Shewhart Control Charts; 1.1. What is ""Statistical Control"" and What is it Good for?; 1.2. Types of Control Charts; 1.3. The Role of Control Charts in Improvement Projects; 1.3.1. ""Fix the Process, Not the Blame!""; 1.3.2. The Two-Steps Process Improvement Procedure; 1.4. Establishing Control Limits; 1.5. Ways and Means to Abuse Control Charts; Chapter 2 On Measurement; 2.1. Measurements That Are Relevant; 2.2. Defining Measurements Operationally; 2.3. Accuracy and Precision; 2.3.1. Measuring the Quality of Measurements

2.3.2. A Possible Remedy for Imprecise Measurements2.3.3. The Danger of Using Highly Biased Measurements; 2.4. Cost-Effectiveness in Measurement; 2.5. Conclusion; Supplement 2 More on Precision and Calibration; S2.1. Analyzing the Rules of Thumb for Cp=1; S2.1.1. The Implications of the Borderline Case for Other Cases; S2.2. Application-Dependent Measurement Errors; S2.3. Deriving the Shewhart/Tippett Formula; Chapter 3 Partial Measurement of Quality by Loss Functions and Production Costs; 3.1. Loss Functions; 3.1.1. Calculating the Expected Quadratic Loss (EQL)

3.1.2. Loss Functions for ""smaller-is-better"" and ""larger-is-better""3.1.3. Process Capability Indices; 3.2. Production Costs as Part of Measuring Quality; 3.3. Taguchi's Method to Estimate the QLF and Set Optimal Tolerance Limits; 3.3.1. A Special Case: Processes that are Not Capable; 3.3.2. Selecting a Process; 3.4. The Lack of Validity of Signal-to-Noise Ratios; 3.5. Variance Reduction and the Pareto Principle; Supplement 3 Asymmetrical Loss Functions; Chapter 4 Adjusting Processes Without Tampering; 4.1. Ways and Means to Tamper; 4.1.1. The Nelson Funnel Rules

4.1.2. Discriminating and Correcting Based on Common Variation4.1.3. Regression to the Mean; 4.2. Efficient Adjustment Methods; 4.2.1. Adjusting an In-Control Process and Tampering are NOT Equivalent; 4.2.2. The Harmonic Adjustment Rule; 4.2.3. The Robustness of the Harmonic Rule; 4.2.4. The Generalized Harmonic Rule; 4.2.5. The Five/Ten Rule; 4.2.6. Adjusting Processes with Highly Asymmetrical Loss Functions; 4.3. Setting Economical Tolerances for Processes with Drift; 4.3.1. Setting Optimal Adjustment Tolerances; 4.3.2. The Impact of Drift on Product Tolerance Setting; 4.3.3. How to Adjust

Chapter 5 Shewhart Control Charts for Attributes5.1. np Control Charts for a Single Attribute; 5.1.1. Recalculating the Control Limits; 5.1.2. An Example: Deming's Red Beads Experiment; 5.1.3. Mixtures; 5.2. p Control Charts for a Single Attribute with Varying Subgroup Size; 5.2.1. Mixtures; 5.3. c Control Charts for the Number of Occurrences in a Constant Area of Opportunity; 5.3.1. Demerit Control Charts; 5.3.2. The COPQ Chart - A Special Case of the Demerit Control Chart; 5.3.3. Critique of Demerit and of COPQ Control Charts

5.4. u Control Charts for the Number of Occurrences in a Variable Area of Opportunity

Notes:

Description based upon print version of record.

Includes bibliographical references (p. 353-361) and index.

ISBN:

9789812796295

9812796290