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Progress in Nanoscale Characterization and Manipulation / edited by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai.
- Format:
- Book
- Series:
- Springer Tracts in Modern Physics, 1615-0430 ; 272
- Language:
- English
- Subjects (All):
- Nanoscience.
- Materials--Analysis.
- Materials.
- Spectrum analysis.
- Nanophysics.
- Characterization and Analytical Technique.
- Spectroscopy.
- Local Subjects:
- Nanophysics.
- Characterization and Analytical Technique.
- Spectroscopy.
- Physical Description:
- 1 online resource (VII, 508 p. 333 illus., 26 illus. in color.)
- Edition:
- 1st ed. 2018.
- Place of Publication:
- Singapore : Springer Nature Singapore : Imprint: Springer, 2018.
- Summary:
- This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
- Contents:
- Electron/Ion Optics
- Scanning Electron Microscopy
- Transmission Electron Microscopy
- Scanning Transmission Electron Microscopy (STEM)
- Spectroscopy
- Aberration Corrected Transmission Electron Microscopy and Its Applications
- In situ TEM: Theory and Applications
- Helium Ion Microscopy.
- ISBN:
- 978-981-13-0454-5
- 981-13-0454-8
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